Title :
A realtime time-domain EMI measurement system for measurements above 1 GHz
Author :
Braun, Stephan ; Hoffmann, Christian ; Frech, Arnd ; Russer, Peter
Author_Institution :
Inst. for High-Freq. Eng., Tech. Univ. Munchen, Munich, Germany
Abstract :
Emissions measurements performed in time-domain using ultra-fast analog-to-digital converter and real-time digital signal processing allow to reduce the measurement time by several orders of magnitude. In this paper a novel real-time operating time-domain EMI measurement system is presented for the frequency range up to 3 GHz. For the frequency range up to 1 GHz a noise figure about 8 dB has been achieved, while above 1 GHz the noise figure is below 6 dB. The system uses a multiresolution analog-to-digital converter system. Above 1 GHz an ultra-broadband down converter system with 325 MHz bandwidth allows to perform ultra-fast emission measurements. In comparison to existing heterodyne systems the measurement time is reduced by about a factor of 60 for 1 MHz IF Bandwidth and by a factor of 2000 for an IF Bandwidth of 120 kHz. Measurements have been carried out in the frequency range 30 MHz - 3 GHz and have proven, that the system provides enough sensitivity for measurements over the complete frequency range.
Keywords :
analogue-digital conversion; digital signal processing chips; electromagnetic interference; real-time systems; time-domain analysis; IF bandwidth; bandwidth 1 MHz; bandwidth 120 kHz; bandwidth 325 MHz; frequency 30 MHz to 3 GHz; measurement sensitivity; measurement time reduction; noise figure 8 dB; real-time digital signal processing; realtime time-domain EMI measurement; ultra-broadband down converter system; ultra-fast analog-to-digital converter; ultra-fast emission measurement; Analog-digital conversion; Bandwidth; Digital signal processing; Electromagnetic interference; Frequency measurement; Noise figure; Performance evaluation; Real time systems; Time domain analysis; Time measurement;
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
DOI :
10.1109/ISEMC.2009.5284576