• DocumentCode
    1832431
  • Title

    Modeling of real-shaped LTCC stripline structure having sharpened edges and embedded pores

  • Author

    Jae Hyuk Jang ; Ishitobi, N. ; Chul Ho Kim

  • Author_Institution
    R&D Center, Samsung Electromech., Suwon, South Korea
  • Volume
    2
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    673
  • Abstract
    A real-shaped LTCC stripline model including sharpened edges and embedded pores was proposed and simulated using the high frequency simulator software, HFSS. These structural defects occur when LTCC process is used in real fields. The pores made the characteristic impedance of the stripline increase, and /spl alpha/ and /spl beta/ decrease in the range higher than 6% of corresponding initial values. 6% of /spl beta/ could have an important meaning for circuit designers. Sharpened edge made the characteristic impedance and /spl alpha/ increase, while did not affect /spl beta/.
  • Keywords
    ceramics; porous materials; strip lines; HFSS; characteristic impedance; embedded pores; high-frequency simulator software; real-shaped LTCC stripline model; sharpened edges; structural defects; Ceramics; Circuits; Components, packaging, and manufacturing technology; Composite materials; Conductors; Delamination; Impedance; Packaging; Shape control; Stripline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011710
  • Filename
    1011710