Title :
CMOS-micromachined, Two-dimenisional Transistor Arrays for Neural Recording and Stimulation
Author :
Lin, J.S. ; Chang, S.R. ; Chang, C.H. ; Lu, S.C. ; Chen, H.
Author_Institution :
Nat. Tsing-Hua Univ., Taipei
Abstract :
In-plane microelectrode arrays have proven to be useful tools for studying the connectivities and the functions of neural tissues. However, seldom microelectrode arrays are monolithically-integrated with signal-processing circuits, without which the maximum number of electrodes is limited by the compromise with routing complexity and interferences. This paper proposes a CMOS-compatible, two-dimensional array of oxide-semiconductor field-effect transistors(OSFETs), capable of both recording and stimulating neuronal activities. The fabrication of the OSFETs not only requires simply die- level, post-CMOS micromachining process, but also retains metal layers for monolithic integration with signal-processing circuits. A CMOS microsystem containing the OSFET arrays and gain-programmable recording circuits has been fabricated and tested. The preliminary testing results are presented and discussed.
Keywords :
bioMEMS; field effect transistors; neurophysiology; CMOS microsystem; CMOS-micromachined arrays; gain-programmable recording circuits; in-plane microelectrode arrays; metal layers; monolithic integration; neural tissues; oxide-semiconductor field-effect transistors; post-CMOS micromachining process; signal-processing circuits; two-dimenisional transistor arrays; CMOS technology; Circuit testing; Electrodes; Interference; Microelectrodes; Micromachining; Monolithic integrated circuits; Neurons; Routing; Transconductance; Algorithms; Amplifiers, Electronic; Electrodes, Implanted; Equipment Design; Humans; Iridium; Materials Testing; Microcomputers; Microelectrodes; Models, Theoretical; Nervous System; Neurons; Platinum; Silicon; Transistors, Electronic;
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
Print_ISBN :
978-1-4244-0787-3
DOI :
10.1109/IEMBS.2007.4352802