Title :
Optical scanning probe system for electromagnetic near field measurements
Author :
Takahashi, Masanori ; Kawasaki, Katsumi ; Ohba, Hiroyuki ; Ikenaga, Tomokazu ; Ota, Hiroyasu ; Orikasa, Tatsuru ; Adachi, Nobuyasu ; Ishiyama, Kazushi ; Arai, Ken Ichi
Author_Institution :
Sendai Res. Center, Nat. Inst. of Inf. & Commun. Technol., Sendai, Japan
Abstract :
An optical scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We demonstrate the measurement of electric field distributions using a LiNbO3 crystal substrate and the probe system. We also measure magnetic field distributions above a microstrip line in the gigahertz range using a magnetic garnet thin film. The probe system is also used for measuring electromagnetic field distributions above a commercially available IC.
Keywords :
field strength measurement; garnets; high-speed optical techniques; magnetic thin films; microstrip lines; LiNbO3; electric field distribution measurement; electro-optic crystal substrate; electromagnetic near field distribution; electromagnetic near field measurements; galvano scanner; high speed low-invasive measurement; magnetic garnet thin film; magneto-optic crystal substrate; microstrip line; optical scanning electromagnetic field probe system; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; High speed optical techniques; Magnetic field measurement; Microstrip; Optical films; Probes; Substrates; Velocity measurement; Electromagnetic field; electro-optic effect; galvano scanner; magneto-optic effect;
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
DOI :
10.1109/ISEMC.2009.5284593
