Title :
Automated Measurement of the Bit-Error Rate as a Function of Signal-to-Noise Ratio for Microwave Communications Systems
Author :
Kerczewski, Robert J. ; Daugherty, Elaine S. ; Kramarchuk, Ihor
Author_Institution :
National Aeronautics and Space Administration, Lewis Research Center, Cleveland, Ohio 44135
Abstract :
The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.
Keywords :
Automatic control; Bit error rate; Data communication; Microwave communication; Microwave measurements; NASA; Noise measurement; Process control; Signal to noise ratio; Time measurement;
Conference_Titel :
ARFTG Conference Digest-Spring, 29th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1987.323853
