• DocumentCode
    1832978
  • Title

    Automated Measurement of the Bit-Error Rate as a Function of Signal-to-Noise Ratio for Microwave Communications Systems

  • Author

    Kerczewski, Robert J. ; Daugherty, Elaine S. ; Kramarchuk, Ihor

  • Author_Institution
    National Aeronautics and Space Administration, Lewis Research Center, Cleveland, Ohio 44135
  • Volume
    11
  • fYear
    1987
  • fDate
    31929
  • Firstpage
    17
  • Lastpage
    27
  • Abstract
    The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.
  • Keywords
    Automatic control; Bit error rate; Data communication; Microwave communication; Microwave measurements; NASA; Noise measurement; Process control; Signal to noise ratio; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 29th
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1987.323853
  • Filename
    4119410
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1832978