DocumentCode :
1833032
Title :
Efficient wide-band interpolation of MoM-derived frequency responses using Stoer-Bulirsch algorithm
Author :
Karwowski, Andrzej
Author_Institution :
Dept. of Electron., Silesian Univ. of Technol., Gliwice, Poland
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
249
Lastpage :
252
Abstract :
Availability of computationally efficient techniques for system performance simulation over a broad frequency range is essential in electromagnetic compatibility. Deriving samples of the desired observable from frequency-domain computations at uniform intervals may be prohibitively time consuming for highly resonant structures. This paper examines a technique for generating of wide-band data from Method-of-Moments (MoM) simulation by employing the Neville-type Stoer-Bulirsch inter-polation algorithm supported by adaptive frequency sampling of the observable. The key feature of the approach is its ability to perform interpolation over a wide frequency band with a single rational interpolant. Sample numerical examples demonstrate capability of the approach to greatly improve computational efficiency of MoM-based simulation over a broad frequency band.
Keywords :
electromagnetic compatibility; frequency-domain analysis; interpolation; method of moments; observability; MoM based simulation; MoM-derived frequency responses; Neville-type Stoer-Bulirsch interpolation; Stoer-Bulirsch algorithm; adaptive frequency sampling; broad frequency band; broad frequency range; computational efficiency; computationally efficient technique; efficient wide-band interpolation; electromagnetic compatibility; frequency domain computation; highly resonant structure; method-of-moments simulation; observability; single rational interpolant; system performance simulation; uniform interval; wide frequency band; wideband data; Availability; Computational modeling; Electromagnetic compatibility; Frequency; Interpolation; Moment methods; Resonance; Sampling methods; System performance; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284600
Filename :
5284600
Link To Document :
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