DocumentCode :
1833050
Title :
Automated Noise Parameter Measurement Using a New De-Embedding. Algorithm
Author :
Schwartz, Robert N.
Author_Institution :
Avantek, Inc. 481 Cottonwood Dr. Milpitas, Ca. 95035
Volume :
11
fYear :
1987
fDate :
31929
Firstpage :
52
Lastpage :
58
Keywords :
Acoustic reflection; Automatic testing; Diodes; Impedance; Microwave measurements; Noise figure; Noise measurement; Scattering parameters; Signal to noise ratio; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 29th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1987.323855
Filename :
4119413
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1833050
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