DocumentCode
1833154
Title
Flip chip for AMD K6 microprocessor
Author
Master, Raj N. ; Khan, Mohammed ; Guardado, Maria ; Starr, Orion ; Alcid, Edd ; Khor, Lily
Author_Institution
Adv. Micro Devices Inc., USA
fYear
1998
fDate
25-28 May 1998
Firstpage
311
Lastpage
315
Abstract
Flip-chip technology in the form of Controlled Collapse Connection (C4) was adopted for the AMD K6 microprocessor. The need arose from the pad limitations of wire-bond technology. The necessity of more pads for connectivity resulted in growth of die size. This would have impacted the net die per wafer and, therefore, the capacity of the wafer fabrication facilities. In addition, flip-chip technology afforded increased electrical performance. The paper describes the various materials/processes that were developed and qualified for manufacturing. The paper presents improvement to various traditional processes of flux application, flux cleaning, and underfill. The criterion used for the material and process development is described. In addition, reliability data are presented for two assembly sites, one in the US and the other in Malaysia. The data includes accelerated thermal cycles at two different conditions, and various underfill materials and cleaning methods. Also presented are the improvement to solder joint reliability due to use of underfill. In this particular application, it turned out to be at least 50X. The Malaysian facility is the first outside the United States to practice flip-chip technology in high-volume manufacturing for microprocessor application. This presented significant challenges in developing both equipment and support infrastructure. The paper concludes with a typical line layout of a high volume manufacturing line
Keywords
flip-chip devices; integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; microassembling; microprocessor chips; soldering; surface cleaning; AMD K6 microprocessor; C4 assembly; accelerated thermal cycles; controlled collapse connection; flip-chip technology; flux application; flux cleaning; high-volume manufacturing; line layout; process development; reliability data; solder joint reliability; underfill materials; Assembly; Ceramics; Costs; Electronics packaging; Fabrication; Flip chip; Lead; Microprocessors; Wafer bonding; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location
Seattle, WA
ISSN
0569-5503
Print_ISBN
0-7803-4526-6
Type
conf
DOI
10.1109/ECTC.1998.678711
Filename
678711
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