DocumentCode :
1833208
Title :
A low power and high performance robust digital delay locked loop against noisy environments
Author :
Lee, Jong-Jin ; Yun, Won-Joo ; Jong-Jin Lee ; Kim, Ki-Han ; Park, Nak-Kyu ; Kim, Kwan-Weon ; Choi, Young-Jung ; Ahn, Jin-Hong ; Chung, Byong-Tae
Author_Institution :
Graphics Design Team, Hynix Semicond. Inc., Icheon
fYear :
2008
fDate :
3-5 Nov. 2008
Firstpage :
241
Lastpage :
244
Abstract :
A new low power and high performance robust digital delay locked loop is presented. The DLL has dual loops with single replica block, different-type dual DCC at input and output, replay mode function, rising edge scanner and self-calibrated power down controller (SCPDC) for stable power management. The digital DLL used for multi-Gbps graphics SDRAM is fabricated using a 66 nm DRAM process technology. Experimental results show duty-corrected clock from external duty error of plusmn10%, less than 400 cycle locking time, 1.4 GHz operation frequency at 1.7 V and 1.7 GHz at 2.0 V.
Keywords :
CMOS logic circuits; DRAM chips; clocks; delay lock loops; low-power electronics; nanoelectronics; DRAM process technology; digital delay locked loop; dual DCC; duty-corrected clock; edge scanner; external duty error; frequency 1.4 GHz; frequency 1.7 GHz; low-power DLL; multiGbps graphics SDRAM; power management; replay mode function; self-calibrated power down controller; single replica block; size 66 nm; voltage 1.7 V; voltage 2.0 V; Clocks; Control systems; Delay lines; Energy consumption; Energy management; Error correction codes; Graphics; Random access memory; Robustness; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-2604-1
Electronic_ISBN :
978-1-4244-2605-8
Type :
conf
DOI :
10.1109/ASSCC.2008.4708773
Filename :
4708773
Link To Document :
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