Title :
Optimization of microcode Built-in Self Test by enhanced faults coverage for embedded memory
Author :
Kapse, Vinod ; Arif, Mohammed
Abstract :
In modern day, embedded memory density and area on-chip is increasing, it is essential to define new test algorithms which fulfill the need of detecting new faults. The existing March algorithms consist of as many as four or seven operations per March element. In this paper we have presented an optimization of architecture which can implement these new March BLC tests having number of operations per element according to the today´s growing needs of embedded memory testing with enhanced fault using Verilog HDL as a primary language and used Modelsim SE 6.5 f as simulation tool.
Keywords :
built-in self test; hardware description languages; storage management chips; system-on-chip; March BLC test; Modelsim SE 6.5 f; Verilog HDL; area on-chip; embedded memory density; embedded memory fault; fault coverage; microcode built-in self test; Algorithm design and analysis; Built-in self-test; Circuit faults; Clocks; Generators; Random access memory; Built-in Self Test (BIST); Hardware Descriptive Language (HDL); embedded memory fault;
Conference_Titel :
Electrical, Electronics and Computer Science (SCEECS), 2012 IEEE Students' Conference on
Conference_Location :
Bhopal
Print_ISBN :
978-1-4673-1516-6
DOI :
10.1109/SCEECS.2012.6184782
