• DocumentCode
    1833428
  • Title

    A 0.5V 4.85Mbps dual-mode baseband transceiver with extended frequency calibration for biotelemetry applications

  • Author

    Yu, Jui-Yuan ; Yu, Chien-Ying ; Huang, Shang-Bin ; Chen, Tsan-Wen ; Chen, Juinn-Ting ; Kuo, Kuan-Ling ; Lee, Chen-Yi

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    This work provides a dual-mode transceiver chipset for wireless body area network (WBAN). The modulation schemes include both MT-CDMA and OFDM. A phase-frequency tunable clock generator (PFTCG) is designed with frequency and phase tuning capability on the fly. A rotator-and-synthesizer driven (RSD) frequency pre-calibration with the aid of the PFTCG enables calibration for extended 100 ppm frequency error (2.5 x of state-of-the-art systems). This chip is manufactured in 90 nm standard CMOS process. The supply voltage to the chip core is globally applied at 0.5 V with 12 power- and voltage-domain partitions for sleep-active and voltage-scaling management. The PFTCG is operated at 5 MHz with RMS jitter 145 ps. The transceiver chipset provides maximum 4.85 Mbps data rate with 73.7% power reduction in baseband circuit processing.
  • Keywords
    CMOS integrated circuits; OFDM modulation; body area networks; clocks; code division multiple access; phase locked loops; transceivers; CMOS process; MT-CDMA; OFDM; biotelemetry; bit rate 4.85 Mbit/s; dual-mode baseband transceiver; extended frequency calibration; frequency 5 MHz; phase locked loops; phase-frequency tunable clock generator; size 90 nm; voltage 0.5 V; wireless body area network; Baseband; Biomedical telemetry; Body sensor networks; Calibration; Clocks; Frequency; OFDM modulation; Transceivers; Tunable circuits and devices; Voltage; PLL; WBAN; power domain; voltage scaling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-1-4244-2604-1
  • Electronic_ISBN
    978-1-4244-2605-8
  • Type

    conf

  • DOI
    10.1109/ASSCC.2008.4708785
  • Filename
    4708785