Title :
Parameter variations and impact on circuits and microarchitecture
Author :
Borkar, Shekhar ; Karnik, Tanay ; Narendra, Siva ; Tschanz, Jim ; Keshavarzi, Ali ; De, Vivek
Author_Institution :
Circuit Res., Intel Labs, Hillsboro, OR, USA
Abstract :
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.
Keywords :
VLSI; design for manufacture; microprocessor chips; parameter estimation; body bias; frequency bins; high performance design; microarchitecture; parameter variation; process variations; temperature variations; voltage variations; CMOS technology; Circuits; Frequency; Microarchitecture; Microcomputers; Microprocessors; Permission; Temperature; Very large scale integration; Voltage;
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
DOI :
10.1109/DAC.2003.1219020
