DocumentCode :
1833490
Title :
Death, taxes and failing chips
Author :
Visweswariah, Chandu
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2003
fDate :
2-6 June 2003
Firstpage :
343
Lastpage :
347
Abstract :
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important aspect of high-performance digital integrated circuit design, and indispensable for first-time-right hardware and cutting-edge performance. This invited paper discusses the methodology, analysis, synthesis and modeling aspects of this problem. These aspects of the problem are compared and contrasted in the ASIC and custom (microprocessor) domains. This paper pays particular attention to statistical timing analysis and enumerates desirable attributes that would render such an analysis capability practical and accurate.
Keywords :
application specific integrated circuits; design aids; integrated circuit design; integrated circuit reliability; microprocessor chips; statistical analysis; custom domains; design methodology; failing chips; microprocessor domains; parametric yield prediction; statistical timing analysis; Circuit synthesis; Clocks; Delay; Finance; Hardware; Noise cancellation; Permission; RLC circuits; Timing; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
Type :
conf
DOI :
10.1109/DAC.2003.1219021
Filename :
1219021
Link To Document :
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