Title : 
Using a single-ended TRL calibration pattern to de-embed coupled transmission lines
         
        
            Author : 
Zhang, Jianmin ; Chen, Qinghua B. ; Qiu, Zhiqiang ; Drewniak, James L. ; Orlandi, Antonio
         
        
            Author_Institution : 
CISCO Syst., Inc., San Jose, CA, USA
         
        
        
        
        
        
            Abstract : 
Transmission line port de-embedding is critical in characterization and modeling for high-speed digital systems. De-embedding technique for single-ended transmission lines has been developed and widely used. However, few de-embedding techniques for coupled transmission lines have been reported in the literature. In this paper, a de-embedding technique for coupled transmission lines using a single-ended TRL (Thru-Reflect-Line) calibration pattern is proposed. It is based on directly obtaining VNA (Vector Network Analyzer) error correction data from measurement and post data processing. As accurate de-embedding is related to the equipments used in the measurement, the proposed technique is verified on two different VNAs with different architectures including a three-sampler VNA and a four-sampler VNA. Good agreement of de-embedded mixed-mode S-parameters has been achieved on both VNAs.
         
        
            Keywords : 
calibration; coupled transmission lines; error correction; network analysers; telecommunication transmission lines; data processing; deembed coupled transmission lines; high-speed digital systems; single-ended TRL calibration; thru-reflect-line calibration pattern; vector network analyzer error correction data; Calibration; Couplings; Data analysis; Data processing; Digital systems; Error analysis; Error correction; Scattering parameters; Transmission line measurements; Transmission lines;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
         
        
            Conference_Location : 
Austin, TX
         
        
            Print_ISBN : 
978-1-4244-4266-9
         
        
            Electronic_ISBN : 
978-1-4244-4058-0
         
        
        
            DOI : 
10.1109/ISEMC.2009.5284624