Title :
Measurement of the Excess Noise of a One-Port Device
Author :
Griffiths, James R. ; Cerney, John L.
Author_Institution :
Texas Instruments Incorporated, P.O. Box 655474 MS 255, Dallas, TX 75265
Abstract :
In the past, excess noise measurements have been difficult to make and repeat. This has been due to test equipment performance limitations and uncertainties associated with these types of measurements. In this paper a new measurement technique is introduced that provides greater accuracy and improved repeatability.
Keywords :
Dynamic range; Gain measurement; Impedance measurement; Low-noise amplifiers; Noise figure; Noise measurement; Power combiners; Power measurement; Test equipment; Testing;
Conference_Titel :
ARFTG Conference Digest-Winter, 30th
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1987.323886
