• DocumentCode
    1833690
  • Title

    Delay and slew metrics using the lognormal distribution

  • Author

    Alpert, C.J. ; Liu, F. ; Kashyap, C. ; Devgan, A.

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    2003
  • fDate
    2-6 June 2003
  • Firstpage
    382
  • Lastpage
    385
  • Abstract
    For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Since one cannot often afford to run AWE, constant time solutions are required. This work presents the first complete solution to closed form formulae for both delay and slew. Our metrics are derived from matching circuit moments to the lognormal distribution. From a single table, one can easily implement the metrics for delay and slew for both step and ramp inputs. Experiments validate the effectiveness of the metrics for nets from a real industrial design.
  • Keywords
    delay estimation; integrated circuit interconnections; log normal distribution; interconnect delay; lognormal distribution; physical synthesis; slew metrics; static timing analysis; Algorithm design and analysis; Circuit simulation; Circuit synthesis; Computational modeling; Delay estimation; Integrated circuit interconnections; Linear circuits; Permission; Physics computing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2003. Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    1-58113-688-9
  • Type

    conf

  • DOI
    10.1109/DAC.2003.1219029
  • Filename
    1219029