Title :
Intelligent backtracking in test generation for combinational circuits
Author :
Zeng, W.B. ; Wei, D.Z.
Author_Institution :
CAD Open Lab., Acad. Sinica, Beijing, China
Abstract :
An intelligent backtracking algorithm for the test generation of combinational circuits is introduced. This algorithm, called INBACK, differs from PODEM and FAN in that, when a contradiction occurs, it chooses a backtracking element which is most likely to eliminate the contradiction and change its value. An efficient method of identifying such backtracking elements is established. Experiments on 5 of 10 benchmark circuits with this method show that the average backtracking times are reduced
Keywords :
automatic testing; combinatorial circuits; logic testing; INBACK; backtracking times; benchmark circuits; combinational circuits; contradiction; intelligent backtracking algorithm; test generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Computers; Laboratories; Resumes;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1989. ICCD '89. Proceedings., 1989 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-1971-6
DOI :
10.1109/ICCD.1989.63326
