• DocumentCode
    1833793
  • Title

    Bandwidth extension for ultra-wideband CMOS low-noise amplifiers

  • Author

    Chi, Baoyong ; Zhang, Chun ; Wang, ZhiHua

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    968
  • Lastpage
    971
  • Abstract
    Techniques are proposed to enhance the bandwidth of ultra-wideband (UWB) CMOS low-noise amplifiers (LNA). By using multiple-input-branch technique and resistive shunt- feedback technique, LNA could achieve ultra-wideband input impedance matching with small noise figure degradation. The gain bandwidth is enhanced by an L type inter-stage matching network between the input transistors and the cascode transistor which could enhance both the gain and the gain bandwidth. The gain bandwidth could be further enhanced by the resistors inserted between the bulks and the sources of the input transistors since the resistors could reduce the effects of the drain-bulk capacitance of the input transistors. The techniques proposed offer the advantages of ultra-wideband bandwidth, simple circuit topology, and small chip area. The proofs of techniques are demonstrated by designing the UWB LNA in UMC 0.18um CMOS.
  • Keywords
    CMOS integrated circuits; impedance matching; low noise amplifiers; network topology; ultra wideband technology; L type inter-stage matching network; bandwidth extension; cascode transistor; circuit topology; drain-bulk capacitance; gain bandwidth; multiple-input-branch technique; noise figure degradation; resistive shunt-feedback technique; size 0.18 mum; ultra-wideband CMOS low-noise amplifiers; ultra-wideband input impedance matching; Bandwidth; Capacitance; Circuit topology; Degradation; Feedback; Impedance matching; Low-noise amplifiers; Noise figure; Resistors; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541581
  • Filename
    4541581