DocumentCode :
1833805
Title :
Equivalent mixed-mode characteristic impedances for differential signal vias
Author :
Pan, Siming ; Fan, Jun
Author_Institution :
UMR/MST EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
74
Lastpage :
79
Abstract :
Differential signal via structures in multi-layer printed circuit boards (PCBs) and packages are studied using an equivalent coupled multi-conductor transmission-line model. Thus, easy-to-understand transmission-line concepts, such as mixed-mode characteristic impedances and propagation constants, can be used to characterize the performance of differential signal via structures in a signal path. The closed-form expressions of per-unit-length parameters in the equivalent coupled multi-conductor transmission-line model are derived based on a physics-based via circuit model with parallel-plane impedances and via-plate capacitances. Mode conversions are discussed for different via structures. Effects of geometrical parameters on equivalent differential via impedances are studied in the paper as well. The proposed method provides a straightforward approach to design differential via structures for better signal integrity.
Keywords :
capacitance; electric impedance; electronics packaging; equivalent circuits; multiconductor transmission lines; printed circuits; PCB; differential signal via structures; electronics packaging; equivalent coupled multiconductor transmission-line model; equivalent mixed-mode characteristic impedances; geometrical parameters; multilayer printed circuit boards; per-unit-length parameters; propagation constants; via-plate capacitances; Capacitance; Coupling circuits; Impedance; Multiconductor transmission lines; Packaging; Power transmission lines; Propagation constant; Signal design; Transmission line theory; Transmission lines; differential via structures; equivalent mixed-mode characteristic impedances; mode conversions; multi-conductor transmission line; multi-layer PCBs and packages; signal integrity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284632
Filename :
5284632
Link To Document :
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