• DocumentCode
    1833881
  • Title

    Active probes for creating H-field probes for flat frequency response

  • Author

    Mittal, Surbhi ; Zhang, Ji ; Pommerenke, David ; Drewniak, James L. ; Hu, Kuifeng ; Dong, Xiaopeng

  • Author_Institution
    Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    12
  • Lastpage
    17
  • Abstract
    This paper presents an approach to obtain a flat frequency response from the first order derivative behavior of an electrically small loop and electrically short electric field probe by using them in combination with active oscilloscope probes. An H-field probe made in flex circuit technology was designed to operate up to about 5 GHz. These probes have loop dimensions as small as 3 times 3 mil and trace widths in the order of 1.75 mils. The H-field probe terminals are connected to the differential amplifier of the active oscilloscope probe which functions as an integrator to achieve a flat frequency response. The integrator behavior compensates for the first order derivative response of the flex circuit probes. The E-field probe utilizes the high input impedance of the browser attached to the active probe for achieving a flat frequency response.
  • Keywords
    electric sensing devices; flexible electronics; frequency response; probes; H-field probes; active probes; electrically short electric field probe; first order derivative behavior; flat frequency response; flex circuit technology; Circuit testing; Connectors; Coupling circuits; Electromagnetic compatibility; Flexible electronics; Frequency conversion; Frequency response; Oscilloscopes; Probes; Radio frequency; E-dot sensor; H-dot sensor; derivative; flat frequency response; integrator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284635
  • Filename
    5284635