DocumentCode
1833881
Title
Active probes for creating H-field probes for flat frequency response
Author
Mittal, Surbhi ; Zhang, Ji ; Pommerenke, David ; Drewniak, James L. ; Hu, Kuifeng ; Dong, Xiaopeng
Author_Institution
Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2009
fDate
17-21 Aug. 2009
Firstpage
12
Lastpage
17
Abstract
This paper presents an approach to obtain a flat frequency response from the first order derivative behavior of an electrically small loop and electrically short electric field probe by using them in combination with active oscilloscope probes. An H-field probe made in flex circuit technology was designed to operate up to about 5 GHz. These probes have loop dimensions as small as 3 times 3 mil and trace widths in the order of 1.75 mils. The H-field probe terminals are connected to the differential amplifier of the active oscilloscope probe which functions as an integrator to achieve a flat frequency response. The integrator behavior compensates for the first order derivative response of the flex circuit probes. The E-field probe utilizes the high input impedance of the browser attached to the active probe for achieving a flat frequency response.
Keywords
electric sensing devices; flexible electronics; frequency response; probes; H-field probes; active probes; electrically short electric field probe; first order derivative behavior; flat frequency response; flex circuit technology; Circuit testing; Connectors; Coupling circuits; Electromagnetic compatibility; Flexible electronics; Frequency conversion; Frequency response; Oscilloscopes; Probes; Radio frequency; E-dot sensor; H-dot sensor; derivative; flat frequency response; integrator;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4266-9
Electronic_ISBN
978-1-4244-4058-0
Type
conf
DOI
10.1109/ISEMC.2009.5284635
Filename
5284635
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