• DocumentCode
    1833900
  • Title

    A measurement technique for ESD current spreading on a PCB using near field scanning

  • Author

    Huang, Wei ; Pommerenke, David ; Xiao, Jiang ; Liu, Dazhao ; Min, Jin ; Muchaidze, Giorgi ; Kwon, Soonjae ; Kim, Ki Hyuk

  • Author_Institution
    Missouri Sci. & Technol., Missouri Sci. & Technologyx, Rolla, MO, USA
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    18
  • Lastpage
    23
  • Abstract
    Electrostatic discharge (ESD) can cause interference or damage in circuits in many ways e.g., by E- or H-field coupling or via conduction paths. Although we can roughly estimate the voltage and current at the injection point during an ESD event, the real offending parameter is mostly the ESD current spreading throughout the system. Those currents can be simulated if great simplifications of the system are accepted. However, even in moderately complex systems the ability to simulate is limited by lack of models and computational resources. Independent of the complexity, but obviously not free of its own limitations is a measurement technique that captures the current as a function of time and location through the system. This article describes the proof on concept of ESD such a measurement technique that allows reconstructing the spreading current as a movie from magnetic field measurements. It details the technique, question of probe selection and how to process the data to present the current spread as a movie.
  • Keywords
    electrostatic discharge; magnetic field measurement; printed circuits; ESD current spreading; PCB; electrostatic discharge; magnetic field measurements; near field scanning; Circuit simulation; Computational modeling; Coupling circuits; Electrostatic discharge; Electrostatic interference; Magnetic field measurement; Measurement techniques; Motion pictures; Probes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284636
  • Filename
    5284636