DocumentCode :
1833900
Title :
A measurement technique for ESD current spreading on a PCB using near field scanning
Author :
Huang, Wei ; Pommerenke, David ; Xiao, Jiang ; Liu, Dazhao ; Min, Jin ; Muchaidze, Giorgi ; Kwon, Soonjae ; Kim, Ki Hyuk
Author_Institution :
Missouri Sci. & Technol., Missouri Sci. & Technologyx, Rolla, MO, USA
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
18
Lastpage :
23
Abstract :
Electrostatic discharge (ESD) can cause interference or damage in circuits in many ways e.g., by E- or H-field coupling or via conduction paths. Although we can roughly estimate the voltage and current at the injection point during an ESD event, the real offending parameter is mostly the ESD current spreading throughout the system. Those currents can be simulated if great simplifications of the system are accepted. However, even in moderately complex systems the ability to simulate is limited by lack of models and computational resources. Independent of the complexity, but obviously not free of its own limitations is a measurement technique that captures the current as a function of time and location through the system. This article describes the proof on concept of ESD such a measurement technique that allows reconstructing the spreading current as a movie from magnetic field measurements. It details the technique, question of probe selection and how to process the data to present the current spread as a movie.
Keywords :
electrostatic discharge; magnetic field measurement; printed circuits; ESD current spreading; PCB; electrostatic discharge; magnetic field measurements; near field scanning; Circuit simulation; Computational modeling; Coupling circuits; Electrostatic discharge; Electrostatic interference; Magnetic field measurement; Measurement techniques; Motion pictures; Probes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284636
Filename :
5284636
Link To Document :
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