Title :
Time-Domain Metrology, Past, Present and Future
Author :
Stinehelfer, H.E., Sr.
Abstract :
The history of the use of time-domain metrology covers many decades of changing methods and analysis. This has gained momentum in the last 20 years with the advent of computer processing. The transformation algorithms from frequency to time have expanded to display information concerning wave distortion and reflection analysis.
Keywords :
Bandwidth; Frequency; Gallium nitride; Laboratories; Metrology; Q measurement; Sampling methods; Strontium; Time domain analysis; Wideband;
Conference_Titel :
ARFTG Conference Digest-Spring, 31st
Conference_Location :
New York City, NY, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1988.323896
