Title :
A 6b stochastic flash analog-to-digital converter without calibration or reference ladder
Author :
Weaver, Skyler ; Hershberg, Benjamin ; Knierim, Daniel ; Moon, Un-Ku
Author_Institution :
Sch. of EELS, Oregon State Univ., Corvallis, OR
Abstract :
A 6-bit stochastic flash ADC is presented. By connecting many comparators in parallel, a reference ladder is avoided by allowing random offset to set individual trip points. The ADC transfer function is the cumulative density function of comparator offset. A technique is proposed to improve transfer function linearity by 8.5 dB. A test chip, fabricated in 0.18 mum CMOS, achieves ENOB over 4.9 b up to 18 MS/s with 900 mV supply and comparator offset standard deviation of 140 mV Comparators are digital cells to allow automated synthesis. Total core power consumption when fs = 8 MHz is 631muW.
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); flash memories; ADC transfer function; CMOS; ENOB; comparator offset; comparators; cumulative density function; size 0.18 mum; stochastic flash analog-to-digital converter; storage capacity 6 bit; voltage 900 mV; Analog-digital conversion; Ash; Calibration; Circuits; Gaussian distribution; Probability density function; Stochastic processes; Transfer functions; USA Councils; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-2604-1
Electronic_ISBN :
978-1-4244-2605-8
DOI :
10.1109/ASSCC.2008.4708805