• DocumentCode
    1833986
  • Title

    A New Approach to Planar Structure Characterization Using Time Domain Techniques

  • Author

    Fidanboylu, K.M. ; Muthukrishnan, N. ; Riad, S.M. ; Elshabini-Riad, A.

  • Author_Institution
    Virginia Polytechnic Institute and State University, Electrical Engineering Department, Blacksburg, VA 24061
  • Volume
    13
  • fYear
    1988
  • fDate
    32264
  • Firstpage
    19
  • Lastpage
    28
  • Abstract
    A new approach for planar transmission line characterization is presented. The approach is based on using time domain techniques for characterizing the coaxial to planar adapter probes used in the measurements. The characterization is achieved by developing an equivalent network model for the probes with the aid of a transient circuit analysis computer program.
  • Keywords
    Circuit analysis computing; Circuit simulation; Coaxial components; Computational modeling; Computer networks; Geometry; Probes; Scattering parameters; Time measurement; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 31st
  • Conference_Location
    New York City, NY, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1988.323898
  • Filename
    4119460
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1833986