DocumentCode
1833989
Title
Edge effects in pixelated CdZnTe gamma detectors
Author
Shor, Asher ; Eisen, Yossi ; Mardor, Israel
Author_Institution
Soreq Nucl. Res. Center, Yavne´´el, Israel
Volume
5
fYear
2003
fDate
19-25 Oct. 2003
Firstpage
3342
Abstract
Edge effects in pixelated CdZnTe detectors are a result of the high dielectric constant of the CdZnTe detector material, and the tendency of the field lines emanating from the "hole" charge carriers to remain within the detector volume. As a result spectra for edge and corner pixels tend to exhibit a longer low energy tail at the expense of the number of events in the photo-peak. We focus on a thick pixelated CdZnTe detector, where, the detector thickness is comparable to the lateral size. We develop a theoretical Monte-Carlo simulation that well describes the experimentally observed edge effects. We show that when the same detector is embedded in an array of similar detector at the same HV, the edge effects disappear, and the spectral properties of even the central pixels improve noticeably.
Keywords
Monte Carlo methods; gamma-ray detection; permittivity; position sensitive particle detectors; semiconductor counters; HV potential; Monte-Carlo simulation; central pixels; corner pixel spectra; detector array; detector thickness; detector volume; edge effects; edge pixel spectra; field lines; high dielectric constant; hole charge carriers; lateral detector size; low energy tail; photopeak; pixelated CdZnTe gamma detectors; spectral properties; Charge carriers; Dielectric materials; Electrodes; Gamma ray detection; Gamma ray detectors; High-K gate dielectrics; Sensor arrays; Signal processing; Tail; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8257-9
Type
conf
DOI
10.1109/NSSMIC.2003.1352622
Filename
1352622
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