• DocumentCode
    1833989
  • Title

    Edge effects in pixelated CdZnTe gamma detectors

  • Author

    Shor, Asher ; Eisen, Yossi ; Mardor, Israel

  • Author_Institution
    Soreq Nucl. Res. Center, Yavne´´el, Israel
  • Volume
    5
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    3342
  • Abstract
    Edge effects in pixelated CdZnTe detectors are a result of the high dielectric constant of the CdZnTe detector material, and the tendency of the field lines emanating from the "hole" charge carriers to remain within the detector volume. As a result spectra for edge and corner pixels tend to exhibit a longer low energy tail at the expense of the number of events in the photo-peak. We focus on a thick pixelated CdZnTe detector, where, the detector thickness is comparable to the lateral size. We develop a theoretical Monte-Carlo simulation that well describes the experimentally observed edge effects. We show that when the same detector is embedded in an array of similar detector at the same HV, the edge effects disappear, and the spectral properties of even the central pixels improve noticeably.
  • Keywords
    Monte Carlo methods; gamma-ray detection; permittivity; position sensitive particle detectors; semiconductor counters; HV potential; Monte-Carlo simulation; central pixels; corner pixel spectra; detector array; detector thickness; detector volume; edge effects; edge pixel spectra; field lines; high dielectric constant; hole charge carriers; lateral detector size; low energy tail; photopeak; pixelated CdZnTe gamma detectors; spectral properties; Charge carriers; Dielectric materials; Electrodes; Gamma ray detection; Gamma ray detectors; High-K gate dielectrics; Sensor arrays; Signal processing; Tail; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1352622
  • Filename
    1352622