Title :
Application of C-COM for microwave integrated-circuit modeling
Author :
Lan, K. ; Chaudhuri, S.K. ; Safavi-Naeini, S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Abstract :
The concurrent complementary operators method (C-COM) is extended for the FDTD simulation of microwave integrated circuits for the first time. Fields in the boundary layers are computed twice with the dispersive boundary condition (DBC) and its complementary operator to truncate the FDTD lattices. The two simulations are averaged to annihilate the first order reflections from the truncated boundary. Numerical error analysis show that the reflections are further suppressed by at least 20 dB due to the implementation of complementary operators, and the setup of parameters becomes easier and more robust. A flexible and highly efficient absorbing boundary condition for guided wave problems is thus obtained through the combination of C-COM and DBC. Simulation results for a modified microstrip transmission line and a microstrip impedance transformer are given to validate this method.
Keywords :
circuit simulation; electromagnetic field theory; error analysis; finite difference time-domain analysis; high-frequency transformers; integrated circuit modelling; microstrip circuits; microwave integrated circuits; C-COM; DBC; DBC complementary operators; FDTD lattice truncation; FDTD simulation; IC modeling; absorbing boundary condition; boundary layer fields; computer simulations; concurrent complementary operators method; dispersive boundary condition; finite difference time-domain; first order reflection annihilation; guided wave problems; microstrip impedance transformer; microstrip transmission line; microwave integrated-circuit modeling; numerical error analysis; parameter setup; reflection suppression; truncated boundary; Boundary conditions; Computational modeling; Dispersion; Finite difference methods; Integrated circuit modeling; Microstrip; Microwave integrated circuits; Microwave theory and techniques; Reflection; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1011772