Title :
Time-Domain Method for Measuring Nonlinear Effects of Active Microwave Devices
Author :
Laundrie, Andrew ; Shen, Zhi-Yuan ; Hanson, Eric
Author_Institution :
HYPRES, INC., ELMSFORD, NEW YORK; "Microwaves & RF." 10 Holland Dr., Hasbrouck Heights, NJ 07604, (201) 393-6372
Abstract :
The conventional way to measure the nonlinear behavior of active microwave devices is by using a spectrum analyzer. However, due to lack of phase information, the real waveform of the distorted signal cannot be obtained in this way. On the other hand, using an oscilloscope to show the waveform is an old technique for low fkequency signals. Until recently, this technique was not suitable for microwave frequencies.
Keywords :
Microwave devices; Microwave measurements; Microwave theory and techniques; Oscilloscopes; Sampling methods; Schottky diodes; Semiconductor device measurement; Superconducting microwave devices; Time domain analysis; Time measurement;
Conference_Titel :
ARFTG Conference Digest-Spring, 31st
Conference_Location :
New York City, NY, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1988.323899