DocumentCode
1834026
Title
Time-Domain Method for Measuring Nonlinear Effects of Active Microwave Devices
Author
Laundrie, Andrew ; Shen, Zhi-Yuan ; Hanson, Eric
Author_Institution
HYPRES, INC., ELMSFORD, NEW YORK; "Microwaves & RF." 10 Holland Dr., Hasbrouck Heights, NJ 07604, (201) 393-6372
Volume
13
fYear
1988
fDate
24-24 May 1988
Firstpage
29
Lastpage
34
Abstract
The conventional way to measure the nonlinear behavior of active microwave devices is by using a spectrum analyzer. However, due to lack of phase information, the real waveform of the distorted signal cannot be obtained in this way. On the other hand, using an oscilloscope to show the waveform is an old technique for low fkequency signals. Until recently, this technique was not suitable for microwave frequencies.
Keywords
Microwave devices; Microwave measurements; Microwave theory and techniques; Oscilloscopes; Sampling methods; Schottky diodes; Semiconductor device measurement; Superconducting microwave devices; Time domain analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 31st
Conference_Location
New York City, NY, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1988.323899
Filename
4119461
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