DocumentCode :
1834026
Title :
Time-Domain Method for Measuring Nonlinear Effects of Active Microwave Devices
Author :
Laundrie, Andrew ; Shen, Zhi-Yuan ; Hanson, Eric
Author_Institution :
HYPRES, INC., ELMSFORD, NEW YORK; "Microwaves & RF." 10 Holland Dr., Hasbrouck Heights, NJ 07604, (201) 393-6372
Volume :
13
fYear :
1988
fDate :
24-24 May 1988
Firstpage :
29
Lastpage :
34
Abstract :
The conventional way to measure the nonlinear behavior of active microwave devices is by using a spectrum analyzer. However, due to lack of phase information, the real waveform of the distorted signal cannot be obtained in this way. On the other hand, using an oscilloscope to show the waveform is an old technique for low fkequency signals. Until recently, this technique was not suitable for microwave frequencies.
Keywords :
Microwave devices; Microwave measurements; Microwave theory and techniques; Oscilloscopes; Sampling methods; Schottky diodes; Semiconductor device measurement; Superconducting microwave devices; Time domain analysis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 31st
Conference_Location :
New York City, NY, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1988.323899
Filename :
4119461
Link To Document :
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