• DocumentCode
    1834026
  • Title

    Time-Domain Method for Measuring Nonlinear Effects of Active Microwave Devices

  • Author

    Laundrie, Andrew ; Shen, Zhi-Yuan ; Hanson, Eric

  • Author_Institution
    HYPRES, INC., ELMSFORD, NEW YORK; "Microwaves & RF." 10 Holland Dr., Hasbrouck Heights, NJ 07604, (201) 393-6372
  • Volume
    13
  • fYear
    1988
  • fDate
    24-24 May 1988
  • Firstpage
    29
  • Lastpage
    34
  • Abstract
    The conventional way to measure the nonlinear behavior of active microwave devices is by using a spectrum analyzer. However, due to lack of phase information, the real waveform of the distorted signal cannot be obtained in this way. On the other hand, using an oscilloscope to show the waveform is an old technique for low fkequency signals. Until recently, this technique was not suitable for microwave frequencies.
  • Keywords
    Microwave devices; Microwave measurements; Microwave theory and techniques; Oscilloscopes; Sampling methods; Schottky diodes; Semiconductor device measurement; Superconducting microwave devices; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 31st
  • Conference_Location
    New York City, NY, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1988.323899
  • Filename
    4119461