DocumentCode :
1834069
Title :
Improved resolution for 3D position sensitive CdZnTe spectrometers
Author :
Zhang, Feng ; He, Zhong ; Xu, Dan ; Knoll, Glenn F. ; Wehe, David K. ; Berry, James E.
Author_Institution :
Dept. of Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
5
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
3356
Abstract :
Two 3-dimensional position sensitive CdZnTe gamma-ray spectrometers based on VAS/TAT ASICs were developed and fully tested. The 1.5×1.5×1 cm3 CdZnTe detectors employ 11×11 pixellated anodes wire-bonded to the readout electronics The pixel number provides the interaction´s lateral coordinates, while the cathode/anode signal ratio and the electron drift time are used to obtain the interaction depth. Data-acquisition and processing software were developed to perform calibration and real-time spectroscopy. An energy resolution of 1.11% FWHM at 662 keV was obtained for single-pixel events from the 120 working pixels of one detector, and an energy resolution of 1.14% FWHM was obtained on the other detector. Significant progress in improving energy resolution for multiple pixel events has been realized. The energy resolution at 662 keV for two-pixel events and three-pixel events were 1.57% FWHM and 2.13% FWHM respectively.
Keywords :
application specific integrated circuits; calibration; data acquisition; gamma-ray detection; gamma-ray spectrometers; gamma-ray spectroscopy; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3-dimensional position sensitive CdZnTe gamma-ray spectrometers; 662 keV; VAS/TAT ASIC; calibration; cathode/anode signal ratio; data acquisition software; data processing software; electron drift time; energy resolution; interaction depth; lateral coordinates; multiple pixel events; pixel number; pixellated anodes; readout electronics; real-time spectroscopy; single-pixel events; three-pixel events; two-pixel events; Anodes; Cathodes; Detectors; Electrons; Energy resolution; Event detection; Readout electronics; Software performance; Spectroscopy; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1352625
Filename :
1352625
Link To Document :
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