• DocumentCode
    1834077
  • Title

    Application of thermoelastic lamination theory to predict warpage of a symmetric and simply supported printed wiring board during temperature cycling

  • Author

    Polsky, Yarom ; Ume, Charles ; Sutherlin, Walter

  • Author_Institution
    Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    345
  • Lastpage
    352
  • Abstract
    The applicability of classical laminated plate theory to the prediction of thermally induced warpage of a printed wiring board is examined in this study. A bare, four-layer printed wiring board without traces has been constructed. The temperature-dependent mechanical properties of the board core materials have been measured. Closed form solutions of the differential equations of equilibrium for the classical lamination theory description of the board are obtained to predict warpage. The model accounts for material property change with temperature, the board´s support conditions, and thermal gradients through the board thickness to assess the role of each in the warpage process. The warpage results predicted by the model are then compared to those obtained experimentally, using the shadow-moire technique in a simulated infrared reflow environment, to assess the model´s accuracy
  • Keywords
    laminates; moire fringes; printed circuit manufacture; reflow soldering; thermoelasticity; board core materials; classical laminated plate theory; four-layer printed wiring board; infrared reflow environment; shadow-moire technique; support conditions; symmetric printed wiring board; temperature cycling; temperature-dependent mechanical properties; thermal gradients; thermoelastic lamination theory; warpage; Closed-form solution; Differential equations; Lamination; Material properties; Mechanical factors; Mechanical variables measurement; Predictive models; Semiconductor device modeling; Thermoelasticity; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678717
  • Filename
    678717