DocumentCode
1834104
Title
Time Scale Calibrations for Time-Domain Measurements
Author
Hanson, Eric ; Shen, Zhi-Yuan
Author_Institution
HYPRES, Inc., Elmsford, New York
Volume
13
fYear
1988
fDate
24-24 May 1988
Firstpage
63
Lastpage
70
Abstract
The time resolution of sampling oscilloscope. Time Domain Reflectometer (TDR), and Time Domain Transmission (TDT) measurements is approaching the low picoseconds. Time scale calibration and linearity verification with picosecond accuracy has become a crucial concem. Several methods for calibrating the time scale and for veriij?ing the sweep linearity of the PSP-1000, which has an intemal rise time of 5 picoseconds, will be described.
Keywords
Attenuation; Calibration; Coaxial components; Length measurement; Linearity; Surface resistance; Time domain analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 31st
Conference_Location
New York City, NY, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1988.323903
Filename
4119465
Link To Document