Title :
Time Scale Calibrations for Time-Domain Measurements
Author :
Hanson, Eric ; Shen, Zhi-Yuan
Author_Institution :
HYPRES, Inc., Elmsford, New York
Abstract :
The time resolution of sampling oscilloscope. Time Domain Reflectometer (TDR), and Time Domain Transmission (TDT) measurements is approaching the low picoseconds. Time scale calibration and linearity verification with picosecond accuracy has become a crucial concem. Several methods for calibrating the time scale and for veriij?ing the sweep linearity of the PSP-1000, which has an intemal rise time of 5 picoseconds, will be described.
Keywords :
Attenuation; Calibration; Coaxial components; Length measurement; Linearity; Surface resistance; Time domain analysis; Time measurement;
Conference_Titel :
ARFTG Conference Digest-Spring, 31st
Conference_Location :
New York City, NY, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1988.323903
