DocumentCode :
1834164
Title :
Damage induced by ionizing radiation on CdZnTe and CdTe detectors
Author :
Fraboni, Beatrice ; Cavallini, Anna ; Dusi, Waldes
Author_Institution :
Dept. of Phys., Bologna Univ., Italy
Volume :
5
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
3370
Abstract :
Radiation damage can strongly affect the performance of detectors and we have carried out a systematic study on the effects of different ionizing radiation on CdTe and CdZnTe detectors. The effects of gamma rays, electrons, neutrons and protons have been investigated by correlating the "macroscopic" performance of the detectors, characterized by gamma spectroscopy measurements, to the "microscopic" effects of impinging radiation, i.e. to the defective states induced within the crystal lattice, by carrying out PICTS (photo-induced current transient spectroscopy) analyses. The comparison of the results obtained from CdTe and CdZnTe allows for the identification of the defects that play a major role in degrading the detectors\´ spectroscopic capabilities.
Keywords :
electron beam effects; gamma-ray effects; gamma-ray spectroscopy; neutron effects; proton effects; semiconductor counters; CdTe detector; CdZnTe detector; crystal lattice defective states; electron effects; gamma ray effects; gamma spectroscopy measurements; impinging radiation; ionizing radiation induced damage; macroscopic detector performance; microscopic effects; neutron effects; photoinduced current transient spectroscopy; proton effects; Electrons; Gamma ray detection; Gamma ray detectors; Gamma ray effects; Ionizing radiation; Neutrons; Protons; Radiation detectors; Spectroscopy; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1352628
Filename :
1352628
Link To Document :
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