Damage induced by ionizing radiation on CdZnTe and CdTe detectors

Author

Fraboni, Beatrice ; Cavallini, Anna ; Dusi, Waldes

Author_Institution

Dept. of Phys., Bologna Univ., Italy

Volume

5

fYear

2003

fDate

19-25 Oct. 2003

Firstpage

3370

Abstract

Radiation damage can strongly affect the performance of detectors and we have carried out a systematic study on the effects of different ionizing radiation on CdTe and CdZnTe detectors. The effects of gamma rays, electrons, neutrons and protons have been investigated by correlating the "macroscopic" performance of the detectors, characterized by gamma spectroscopy measurements, to the "microscopic" effects of impinging radiation, i.e. to the defective states induced within the crystal lattice, by carrying out PICTS (photo-induced current transient spectroscopy) analyses. The comparison of the results obtained from CdTe and CdZnTe allows for the identification of the defects that play a major role in degrading the detectors\´ spectroscopic capabilities.

Keywords

electron beam effects; gamma-ray effects; gamma-ray spectroscopy; neutron effects; proton effects; semiconductor counters; CdTe detector; CdZnTe detector; crystal lattice defective states; electron effects; gamma ray effects; gamma spectroscopy measurements; impinging radiation; ionizing radiation induced damage; macroscopic detector performance; microscopic effects; neutron effects; photoinduced current transient spectroscopy; proton effects; Electrons; Gamma ray detection; Gamma ray detectors; Gamma ray effects; Ionizing radiation; Neutrons; Protons; Radiation detectors; Spectroscopy; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2003 IEEE

ISSN

1082-3654

Print_ISBN

0-7803-8257-9

Type

conf

DOI

10.1109/NSSMIC.2003.1352628

Filename

1352628