Title :
Transient-to-digital converter for ESD protection design in microelectronic systems
Author :
Ker, Ming-Dou ; Yen, Cheng-Cheng ; Liao, Chi-Sheng ; Chen, Tung-Yang ; Tsai, Chih-Chung
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu
Abstract :
An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-mum CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit reliability; integrated circuit testing; transients; CMOS integrated circuit; ESD voltage; electrostatic discharge protection design; fast electrical transient detection; microelectronic system-level ESD protection; on-chip transient-to-digital converter; output digital thermometer codes; size 0.18 mum; system-level ESD events; system-level ESD test; voltage 3.3 V; CMOS digital integrated circuits; CMOS integrated circuits; Circuit testing; Electrostatic discharge; Event detection; Microelectronics; Protection; System testing; System-on-a-chip; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-2604-1
Electronic_ISBN :
978-1-4244-2605-8
DOI :
10.1109/ASSCC.2008.4708814
