• DocumentCode
    1834285
  • Title

    A tunable miniaturized-element frequency selective surfaces without bias network

  • Author

    Che, Yongxing ; Hou, Xinyu ; Gao, Zhengping

  • Author_Institution
    Sch. of Microelectron. & Solid-State Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2011
  • fDate
    22-25 May 2011
  • Firstpage
    70
  • Lastpage
    73
  • Abstract
    A novel bandpass miniaturized-element frequency selective surface with tunable frequency characteristic is presented in this paper. The structure is composed of two Meander-line arrays printed on opposite sides of a dielectric substrate and varactor diodes are positioned between the neighboring Meander-line. By biasing the varactors with the Meander-line themselves, the ability to electronically tune the frequency response is realized. This configuration also eliminates the need for any additional network, and therefore resolves the design difficulties associated with the spurious response of the bias network. Full-wave numerical simulation results about transmission characteristic are showed. From the simulation results, which can be seen that a wide tuning frequency range can be achieved and a good stability with different incident angles and different polarizations are obtained. Its physical size is also far less than one wavelength.
  • Keywords
    antenna arrays; frequency selective surfaces; microstrip antenna arrays; numerical analysis; varactors; Meander-line arrays; bandpass miniaturized-element frequency selective surface; bias network; dielectric substrate; full-wave numerical simulation; tunable miniaturized-element frequency selective surfaces; varactor diodes; Capacitance; Frequency response; Frequency selective surfaces; Geometry; Periodic structures; Tuning; Varactors; Bandpass; electronic tuning; frequency selective surface; varactor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Technology & Computational Electromagnetics (ICMTCE), 2011 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8556-7
  • Type

    conf

  • DOI
    10.1109/ICMTCE.2011.5915165
  • Filename
    5915165