• DocumentCode
    1834287
  • Title

    A new architecture of signature analyzers for multiple-output circuits

  • Author

    Matsushima, Tonioko K. ; Matsushima, Toshiyasu ; Hirasawa, Shigeichi

  • Author_Institution
    Dept. of Inf. Eng., Polytech.. Univ., Sagamihara, Japan
  • Volume
    4
  • fYear
    1997
  • fDate
    12-15 Oct 1997
  • Firstpage
    3900
  • Abstract
    The paper presents an architecture for multiple input signature analyzers. The proposed signature analyzer with Hδ inputs is designed by parallelizing a GLFSR(δ,m), where δ is the number of input signals and m is the number of stages in the feedback shift register. The GLFSR, developed by D.K. Pradhan and S. Gupta (1991), is a general framework for representing LFSR based signature analyzers. The parallelization technique described in the paper can be applied to any kind of GLFSR signature analyzer, e.g., SISRs, MISRs, multiple MISRs and MLFSRs. It is shown that a proposed signature analyzer with Hδ inputs requires less complex hardware than either single GLFSR(Hδ,m)s or parallel construction H original GLFSR(δ,m)s. It is also shown that the proposed parallelization technique can be applied to a test pattern generator in BIST, since the GLFSR is also used to generate patterns for a CUT. The proposed technique would be practical for testing CUTs with a large number of input and output sequences, since the test circuit occupies a smaller area on the LSI chip than conventional test circuits
  • Keywords
    built-in self test; logic analysers; logic circuits; logic testing; shift registers; BIST; CUT; GLFSR signature analyzer; Hδ inputs; LFSR based signature analyzers; LSI chip; MLFSRs; SISRs; circuit under test; feedback shift register; generalised LFSR; input signals; linear feedback shift register; multiple MISRs; multiple input signature analyzers; multiple output circuits; parallel construction H original; parallelization technique; signature analyzers; test circuit; test pattern generator; Automatic testing; Circuit analysis; Circuit faults; Circuit testing; Feedback; Hardware; Large scale integration; Shift registers; Signal analysis; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1062-922X
  • Print_ISBN
    0-7803-4053-1
  • Type

    conf

  • DOI
    10.1109/ICSMC.1997.633280
  • Filename
    633280