Title :
Multiwall carbon nanotube vias: An effective TL model for EMC oriented analysis
Author :
Sarto, M.S. ; Tamburrano, A.
Author_Institution :
Dept. of Electr. Eng., Sapienza Univ. of Rome, Rome, Italy
Abstract :
The paper presents an effective two-port model of a nano-interconnect constituted by a vertical multiwall carbon nanotube (MWCNT) between two horizontal planes. The new developed model is derived combining the quantum-mechanical effects with the analysis of the EM field radiated from the vertical structure, and can be used to predict the signal integrity of MWCNT vias. EMC oriented analyses are performed in the frequency range up to several tens of gigahertz.
Keywords :
carbon nanotubes; electromagnetic compatibility; interconnections; nanotube devices; C; EMC oriented analysis; multiwall carbon nanotube; nanointerconnect; two-port model; vertical structure; vias; Carbon nanotubes; Electromagnetic compatibility; Electromagnetic propagation; Frequency; Integrated circuit interconnections; Nanotechnology; Performance analysis; Predictive models; Signal analysis; Transmission line theory; Nanointerconnect; multiwall carbon nanotube; signal propagation; transmission line; via;
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
DOI :
10.1109/ISEMC.2009.5284651
