• DocumentCode
    1834426
  • Title

    Aspects of field statistics inside nested frequency-stirred reverberation chambers

  • Author

    He, Yuhui ; Marvin, Andrew C.

  • Author_Institution
    Dept. of Electron., Univ. of York, York, UK
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    171
  • Lastpage
    176
  • Abstract
    The magnitude of a component of the electric field ERec inside a single mechanical stirred chamber is known to follow Rayleigh distribution, however, for the field inside an enclosure nested in a larger chamber, the probability distribution function (PDF) of the ERec is unclear. In this paper the hypothesis of the PDF of a frequency stirred ERec is provided and then examined by a number of goodness of fit tests (K-S test). The results show that for an electrically large enclosure nested in a larger reverberation chamber, the PDF of the internal electric field ERec will evolve from Rayleigh to double Rayleigh with the shrinking size of the interconnection aperture. ERec obtained from different positions in the nested equipment enclosure were examined and found consistent; single apertures as well as multiple apertures were investigated to account for the importance of the interfacing aperture to the internal field distribution. This adds to understanding the underlying principles of nested chambers used for Shielding Effectiveness measurements.
  • Keywords
    electromagnetic compatibility; electromagnetic shielding; reverberation chambers; statistical distributions; statistical testing; EMC; Rayleigh distribution; field statistics; goodness-of-fit test; interconnection aperture; internal field distribution; nested equipment enclosure; nested frequency-stirred reverberation chamber; probability distribution function; shielding effectiveness measurement; single mechanical stirred chamber; Apertures; Dipole antennas; Electromagnetic fields; Frequency; Monitoring; Probability distribution; Reverberation chamber; Statistical distributions; Statistics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284658
  • Filename
    5284658