Title :
Predicting noise voltage from trace crossing split planes on printed circuit boards
Author :
Pan, Weifeng ; Connor, Samuel ; Archambeault, Bruce
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
Printed circuit Boards (PCBs) often have high speed data traces crossing splits in the adjacent reference planes due to space limitations and cost constraints. These split planes are usually different power islands on nearby layers. This work quantifies the effect of the split plane and the associated stitching capacitor for various stackup configurations.
Keywords :
capacitors; printed circuits; noise voltage; power islands; printed circuit boards; stackup configurations; stitching capacitor; trace crossing split planes; Capacitors; Circuit noise; Electromagnetic compatibility; Finite difference methods; Inductance; Microstrip; Printed circuits; Space technology; Time domain analysis; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
DOI :
10.1109/ISEMC.2009.5284660
