DocumentCode
1834621
Title
Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity
Author
Park, Yoon-Mi ; Lee, Younju ; So, Joonho ; Cheon, Changyul ; Chung, Young-Seek ; Jung, Hyun-Kyo
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear
2009
fDate
17-21 Aug. 2009
Firstpage
121
Lastpage
126
Abstract
In this paper, a new method, based on the combination of electromagnetic topology (EMT) and mode matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.
Keywords
electromagnetic coupling; electromagnetic wave propagation; topology; FDTD; aperture backed cavity; electric field intensity; electromagnetic field coupling phenomena; electromagnetic field penetration analysis; electromagnetic field propagation path; electromagnetic topology; inner electric system; mode matching; Apertures; Coupling circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic fields; Electromagnetic scattering; Equations; Sparse matrices; Topology; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4266-9
Electronic_ISBN
978-1-4244-4058-0
Type
conf
DOI
10.1109/ISEMC.2009.5284664
Filename
5284664
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