• DocumentCode
    1834621
  • Title

    Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity

  • Author

    Park, Yoon-Mi ; Lee, Younju ; So, Joonho ; Cheon, Changyul ; Chung, Young-Seek ; Jung, Hyun-Kyo

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    121
  • Lastpage
    126
  • Abstract
    In this paper, a new method, based on the combination of electromagnetic topology (EMT) and mode matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.
  • Keywords
    electromagnetic coupling; electromagnetic wave propagation; topology; FDTD; aperture backed cavity; electric field intensity; electromagnetic field coupling phenomena; electromagnetic field penetration analysis; electromagnetic field propagation path; electromagnetic topology; inner electric system; mode matching; Apertures; Coupling circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic fields; Electromagnetic scattering; Equations; Sparse matrices; Topology; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284664
  • Filename
    5284664