DocumentCode :
1834668
Title :
Mechanisms of laser-induced defect formation and In doping in CdTe crystals
Author :
Gnatyuk, V.A. ; Aoki, T. ; Hatanaka, Y.
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
Volume :
5
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
3488
Abstract :
The results of comprehensive investigations of time-resolved optical reflectivity, atomic force microscopy, reflection of high-energy electron diffraction, current-voltage characteristic, exciton photoluminescence in (111)B oriented CdTe crystals subjected to irradiation with nanosecond KrF excimer laser pulses have been discussed. The influence of laser irradiation on the surface state, crystalline and point defect structure was studied. The peculiarities of pulsed-laser-induced melting and following crystallization of the CdTe surface as dependence of laser energy density have been analyzed. The melting and ablation thresholds were determined as 50 mJ/cm2 and 145 mJ/cm2, respectively. Using laser irradiation of CdTe crystals pre-coated with an In dopant film, it was possible to suppress self-compensation mechanisms and fabricate the CdTe-based diodes promising for nuclear radiation detectors. The mechanisms of laser-induced defect formation and doping have been discussed.
Keywords :
II-VI semiconductors; annealing; atomic force microscopy; excimer lasers; indium; laser ablation; melting; photoluminescence; point defects; reflection high energy electron diffraction; reflectivity; semiconductor doping; surface states; (111)B oriented CdTe crystals; CdTe surface; CdTe-based diodes; CdTe:In; In dopant film; ablation thresholds; atomic force microscopy; crystallization; current-voltage characteristics; exciton photoluminescence; high-energy electron diffraction; laser energy density; laser irradiation; laser-induced defect formation; nanosecond KrF excimer laser pulses; nuclear radiation detectors; point defect structure; pulsed-laser-induced melting; self-compensation mechanisms; surface state; time-resolved optical reflectivity; Atom optics; Atomic force microscopy; Crystallization; Doping; Electron optics; Laser ablation; Optical films; Optical microscopy; Optical pulses; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1352663
Filename :
1352663
Link To Document :
بازگشت