• DocumentCode
    1834668
  • Title

    Mechanisms of laser-induced defect formation and In doping in CdTe crystals

  • Author

    Gnatyuk, V.A. ; Aoki, T. ; Hatanaka, Y.

  • Author_Institution
    Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
  • Volume
    5
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    3488
  • Abstract
    The results of comprehensive investigations of time-resolved optical reflectivity, atomic force microscopy, reflection of high-energy electron diffraction, current-voltage characteristic, exciton photoluminescence in (111)B oriented CdTe crystals subjected to irradiation with nanosecond KrF excimer laser pulses have been discussed. The influence of laser irradiation on the surface state, crystalline and point defect structure was studied. The peculiarities of pulsed-laser-induced melting and following crystallization of the CdTe surface as dependence of laser energy density have been analyzed. The melting and ablation thresholds were determined as 50 mJ/cm2 and 145 mJ/cm2, respectively. Using laser irradiation of CdTe crystals pre-coated with an In dopant film, it was possible to suppress self-compensation mechanisms and fabricate the CdTe-based diodes promising for nuclear radiation detectors. The mechanisms of laser-induced defect formation and doping have been discussed.
  • Keywords
    II-VI semiconductors; annealing; atomic force microscopy; excimer lasers; indium; laser ablation; melting; photoluminescence; point defects; reflection high energy electron diffraction; reflectivity; semiconductor doping; surface states; (111)B oriented CdTe crystals; CdTe surface; CdTe-based diodes; CdTe:In; In dopant film; ablation thresholds; atomic force microscopy; crystallization; current-voltage characteristics; exciton photoluminescence; high-energy electron diffraction; laser energy density; laser irradiation; laser-induced defect formation; nanosecond KrF excimer laser pulses; nuclear radiation detectors; point defect structure; pulsed-laser-induced melting; self-compensation mechanisms; surface state; time-resolved optical reflectivity; Atom optics; Atomic force microscopy; Crystallization; Doping; Electron optics; Laser ablation; Optical films; Optical microscopy; Optical pulses; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1352663
  • Filename
    1352663