DocumentCode
1834668
Title
Mechanisms of laser-induced defect formation and In doping in CdTe crystals
Author
Gnatyuk, V.A. ; Aoki, T. ; Hatanaka, Y.
Author_Institution
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
Volume
5
fYear
2003
fDate
19-25 Oct. 2003
Firstpage
3488
Abstract
The results of comprehensive investigations of time-resolved optical reflectivity, atomic force microscopy, reflection of high-energy electron diffraction, current-voltage characteristic, exciton photoluminescence in (111)B oriented CdTe crystals subjected to irradiation with nanosecond KrF excimer laser pulses have been discussed. The influence of laser irradiation on the surface state, crystalline and point defect structure was studied. The peculiarities of pulsed-laser-induced melting and following crystallization of the CdTe surface as dependence of laser energy density have been analyzed. The melting and ablation thresholds were determined as 50 mJ/cm2 and 145 mJ/cm2, respectively. Using laser irradiation of CdTe crystals pre-coated with an In dopant film, it was possible to suppress self-compensation mechanisms and fabricate the CdTe-based diodes promising for nuclear radiation detectors. The mechanisms of laser-induced defect formation and doping have been discussed.
Keywords
II-VI semiconductors; annealing; atomic force microscopy; excimer lasers; indium; laser ablation; melting; photoluminescence; point defects; reflection high energy electron diffraction; reflectivity; semiconductor doping; surface states; (111)B oriented CdTe crystals; CdTe surface; CdTe-based diodes; CdTe:In; In dopant film; ablation thresholds; atomic force microscopy; crystallization; current-voltage characteristics; exciton photoluminescence; high-energy electron diffraction; laser energy density; laser irradiation; laser-induced defect formation; nanosecond KrF excimer laser pulses; nuclear radiation detectors; point defect structure; pulsed-laser-induced melting; self-compensation mechanisms; surface state; time-resolved optical reflectivity; Atom optics; Atomic force microscopy; Crystallization; Doping; Electron optics; Laser ablation; Optical films; Optical microscopy; Optical pulses; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8257-9
Type
conf
DOI
10.1109/NSSMIC.2003.1352663
Filename
1352663
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