• DocumentCode
    1834773
  • Title

    Assembly technique for a fine-pitch, low-noise interface; Joining a CdZnTe pixel-array detector and custom VLSI chip with Au stud bumps and conductive epoxy

  • Author

    Clayton, James E. ; Chen, C. M Hubert ; Cook, Walter R. ; Harrison, Fiona A.

  • Author_Institution
    Polymer Assembly Technol. Inc., Billerica, MA, USA
  • Volume
    5
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    3513
  • Abstract
    Energy resolution of hard X-ray detectors can be adversely affected by the input capacitance between the CdZnTe anodes and ASIC readout chip or mounting substrate. This problem is compounded with minimal separation distances between planes that are on the order of 8-10 microns using typical indium bump bonding methods. An improved technique is presented and compared that increases the separation between planes by adhesively-bonding single or stacked gold stud bumps, which are thermosonically bonded to the array of pads of a custom VLSI chip, with silver-filled conductive epoxy that is stencil printed on the anode contacts of the CdZnTe detector. This technique uses low-force and low-temperature processing and can be adapted to avoid direct contact of the conductive epoxy to the VLSI surface. The assembly of a 24 × 44, 500-micron pitch, pixel array is detailed in this report. This sensor packaging technique is presently being evaluated for the balloon-launched, High Energy Focusing Telescope (HEFT) experiment at the California Institute of Technology.
  • Keywords
    VLSI; application specific integrated circuits; nuclear electronics; readout electronics; semiconductor counters; 8 to 10 micron; ASIC readout chip; Au stud bumps; CdZnTe anodes; CdZnTe pixel-array detector; High Energy Focusing Telescope experiment; VLSI surface; assembly technique; custom VLSI chip; energy resolution; fine-pitch interface; hard X-ray detectors; indium bump bonding methods; low-noise interface; low-temperature processing; pixel array; sensor packaging technique; silver-filled conductive epoxy; Anodes; Application specific integrated circuits; Assembly; Bonding; Capacitance; Energy resolution; Gold; Indium; Very large scale integration; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1352668
  • Filename
    1352668