DocumentCode
1834812
Title
Time Domain Reflectometry Applied to MMIC Passive Component Modeling
Author
Beccari, C. ; Ferrero, A. ; Pisani, U.
Author_Institution
Dipartimento di Elettronica, Politecnico di Torino, Torino, Italy
Volume
15
fYear
1989
fDate
32660
Firstpage
27
Lastpage
36
Abstract
The time domain facilities of a network analyzer, combined with the tools of network synthesis, were recently used for experimental modeling of discontinuities in an S-parameter measurement set, so as to allow the instrument calibration directly to the ports of the device under test. The technique proved to be very useful in those cases where the discontinuities, that lie before the unknown device, cannot be isolated by the usual calibration methods, and therefore, since network synthesis deals only with frequency domain information, it is impossible to optimize the model´s parameters, since they are affected by errors due to discontinuities. This paper describes a procedure which allows to isolate the response of the device under test, and to derive its complete model; when it to reach a reasonable accuracy it gives anyway a topology, which is a good starting point for other optimization routines that can be used for obtaining a better match, on a broad frequency band. This can be accomplished by optimzing the first approach topology to which other circuit elements have been added, so as to take into account second order effects especially at the higher frequencies. The technique was applied to model and characterize passive discrete components used in MMIC. The experimental results show the validity of the approach.
Keywords
Calibration; Circuit topology; Frequency; MMICs; Network synthesis; Reflectometry; Scattering parameters; Testing; Time domain analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 33rd
Conference_Location
Long Beach, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1989.323935
Filename
4119501
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