• DocumentCode
    1834812
  • Title

    Time Domain Reflectometry Applied to MMIC Passive Component Modeling

  • Author

    Beccari, C. ; Ferrero, A. ; Pisani, U.

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Torino, Torino, Italy
  • Volume
    15
  • fYear
    1989
  • fDate
    32660
  • Firstpage
    27
  • Lastpage
    36
  • Abstract
    The time domain facilities of a network analyzer, combined with the tools of network synthesis, were recently used for experimental modeling of discontinuities in an S-parameter measurement set, so as to allow the instrument calibration directly to the ports of the device under test. The technique proved to be very useful in those cases where the discontinuities, that lie before the unknown device, cannot be isolated by the usual calibration methods, and therefore, since network synthesis deals only with frequency domain information, it is impossible to optimize the model´s parameters, since they are affected by errors due to discontinuities. This paper describes a procedure which allows to isolate the response of the device under test, and to derive its complete model; when it to reach a reasonable accuracy it gives anyway a topology, which is a good starting point for other optimization routines that can be used for obtaining a better match, on a broad frequency band. This can be accomplished by optimzing the first approach topology to which other circuit elements have been added, so as to take into account second order effects especially at the higher frequencies. The technique was applied to model and characterize passive discrete components used in MMIC. The experimental results show the validity of the approach.
  • Keywords
    Calibration; Circuit topology; Frequency; MMICs; Network synthesis; Reflectometry; Scattering parameters; Testing; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 33rd
  • Conference_Location
    Long Beach, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1989.323935
  • Filename
    4119501