• DocumentCode
    1834823
  • Title

    Recent Trends in Microwave ATE Systems

  • Author

    Morgan, Cliff

  • Author_Institution
    Microwaves & RF Instruments Div., Tektronix, Inc.
  • Volume
    15
  • fYear
    1989
  • fDate
    32660
  • Firstpage
    37
  • Lastpage
    45
  • Abstract
    Programmable instruments and test systems have assumed a very important role in the last few years. While they are more expensive than their non-programmable counterparts, the cost is easily justified when the same test must be performed repeatedly. Often the most cost-effective approach to automated testing is to purchase a turnkey system from a vendor that supplies all or most of the critical components. This will help ensure that idiosyncrasies between individual components (computer, software, instruments, and peripherals) are circumvented. If purchase of a turnkey system is not possible, several recent industry trends should ease the system integrator´s task. 1) A variety of interface options now exist (IEEE 488, RS-232, VXI, etc.). 2) Emergence of common programming protocol or bus languages for instruments (IEEE 488.2 and MATE/CIIL). 3) Instruments are acquiring intelligent signal processing routines, thus easing the burden on the programmer and instrument controller. 4) Decision-making capability, in the form of downloadable macros, will allow more efficient use of the instrument controller and IEEE 488 bus. 5) Availability of programming tools for those who are using the PC as a system controller (GURU II, ASYST, Lab Windows, EZTEST, etc.). There are still obstacles to be overcome when configuring and programming test equipment for a particular application. With recent industry trends, however, the task is becoming much easier and the benefits much greater.
  • Keywords
    Automatic testing; Computer peripherals; Control systems; Costs; Industrial control; Instruments; Performance evaluation; Protocols; Software; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 33rd
  • Conference_Location
    Long Beach, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1989.323936
  • Filename
    4119502