Title :
On-demand Data Numerosity Reduction for Learning Artifacts
Author :
Kalegele, Khamisi ; Takahashi, Hideyuki ; Sveholm, Johan ; Sasai, Kazuto ; Kitagata, Gen ; Kinoshita, Tetsuo
Author_Institution :
Grad. Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
Abstract :
In domains in which single agent learning is a more natural metaphor for an artifact-embedded agent, Exemplar-Based Learning (EBL) requires significantly large sets of training examples for it to be applicable. Obviously large sets of training examples contradict resource capabilities of artifacts. To make EBL a possibility for these artifacts, sets of training examples must be reduced in size in a way that does not compromise learning performance in order to relieve artifacts´ resources (e.g. memory). In this paper, we investigate training sets requirements for artifacts learning and propose a ranking-based Stratified Ordered Selection (SOS) method to scale them down. Contrary to reduction approaches in mainstream learning, this method has been designed with resource constraint nature of artifacts in mind. Artifacts shall use an intermediary which implements SOS to, dynamically and on-demand, retrieve training subsets based on their resource capacities (e.g. memory, CPU). SOS uses a new Level Order (LO) ranking scheme which has been designed to broaden representation of classes of examples, to quicken data retrieval, and to allow for retrieval of subsets of varying sizes while ensuring same or near same learning performance. We present how SOS evaluates on various well known machine learning datasets and how it compares to some of the best performing data reduction approaches.
Keywords :
data reduction; learning (artificial intelligence); multi-agent systems; agent learning; artifact-embedded agent; artifacts learning; data reduction; data retrieval; exemplar-based learning; learning artifact; level order ranking scheme; machine learning dataset; on-demand data numerosity reduction; ranking-based stratified ordered selection method; resource constraint; Accuracy; Binary trees; Educational institutions; Machine learning; Reliability; Training; Training data; Artificial Intelligence; Data Reduction; Learning;
Conference_Titel :
Advanced Information Networking and Applications (AINA), 2012 IEEE 26th International Conference on
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4673-0714-7
DOI :
10.1109/AINA.2012.108