• DocumentCode
    1834972
  • Title

    Characterization and modelling of parasitic emission of a 32-bit automotive microcontroller mounted on 2 types of BGA

  • Author

    Rogard, Eric ; Vrignon, Bertrand ; Shepherd, John ; Moseley, Richard ; Sicard, Etienne

  • Author_Institution
    Freescale Semicond., Toulouse, France
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    66
  • Lastpage
    71
  • Abstract
    This paper presents the electromagnetic emission (EME) characterization and modelling of a 32-bit microcontroller designed for automotive purposes. The effect of different ball grid array (BGA) packages is investigated in terms of parasitic emission and associated EME model in conducted and radiated modes. Good agreements between measurements and simulations demonstrate the ability of ICEM-based model to handle the emission prediction of complex micro-controllers mounted in high-density, high-performance BGA packages.
  • Keywords
    automotive electronics; ball grid arrays; microcontrollers; ICEM-based model; automotive microcontroller; ball grid array packages; complex microcontrollers emission prediction; electromagnetic emission characterization; electromagnetic emission modelling; high-density BGA packages; high-performance BGA packages; parasitic emission characterization; parasitic emission modelling; Automotive engineering; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit packaging; Microcontrollers; Predictive models; Semiconductor device packaging; BGA packages; Conducted and radiated emission measurement standards; IC-EMC; electromagnetic emission (EME); integrated circuit emission model (ICEM); microcontroller;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284680
  • Filename
    5284680