• DocumentCode
    1835003
  • Title

    New VCCI program — Kit module program

  • Author

    Satake, Shozo ; Shimasaki, Toshiki ; Yamane, Hiroshi

  • Author_Institution
    VCCI Council, Tokyo, Japan
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    122
  • Lastpage
    125
  • Abstract
    VCCI Council introduced the kit module program designed to serve as an intermediary between module manufactures and equipment makers using their modules. Magnetit´ Probe Method, one of the IEEE. 61967 test methods, is employed in the program for its simplicity and low implementation cost. An interposer was developed to bridge target memory module and mother board for operation at the real time frequency and aggregation of power supply circuits for measurement with MP method. The result of pilot measurements of DDR2 memory modules is reported.
  • Keywords
    IEEE standards; electromagnetic interference; electron device testing; DDR2 memory module; IEEE 61967 test method; Magnetit probe method; VCCI program; equipment maker; kit module program; module manufacture; mother board; power supply circuit; real time frequency; Costs; Councils; Current supplies; Electromagnetic interference; Electromagnetic measurements; Frequency; Manufacturing; Noise measurement; Power supplies; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284682
  • Filename
    5284682