DocumentCode :
1835071
Title :
Newly developed passivation of GaAs surfaces and devices
Author :
Xun Wang ; Xiying Chen
Author_Institution :
Surface Phys. Lab., Fudan Univ., Shanghai
fYear :
1995
fDate :
24-28 Oct 1995
Firstpage :
501
Lastpage :
505
Abstract :
In addition to the established methods, we have developed three new passivation techniques. The first one is the electrochemical sulfur passivation, which can create a thick S-containing layer on the top of GaAs substrate. The thick passivation layer can prevent the GaAs surface being reoxidized in air, and thus the stability is greatly improved. The second passivation technique uses an oxygen-free sulfur-containing solvent-S2Cl2. It can remove the oxides of GaAs very effectively and create a S-terminated surface. The third technique is to form a thick GaS overlayer on the top of GaAs by using S glow discharge (SDG). The preliminary results seem to be quite encouraging. It might be possible to eventually solve the problem of surface passivation for GaAs and related III-V compound semiconductors
Keywords :
III-V semiconductors; electrochemistry; gallium arsenide; passivation; plasma applications; semiconductor technology; GaAs; electrochemical method; glow discharge; overlayer; passivation; stability; Argon; Gallium arsenide; Laboratories; Lighting; Passivation; Photoluminescence; Physics; Substrates; Surface discharges; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3062-5
Type :
conf
DOI :
10.1109/ICSICT.1995.503331
Filename :
503331
Link To Document :
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