Title :
A Wide-band 2-path cross-coupled sigma delta ADC
Author :
Bilhan, Erkan ; Maloberti, Franco
Author_Institution :
App. Spec. Prod. Group, Texas Instrum. Inc., Dallas, TX
Abstract :
The performance of a sigma-delta ADC can be increased by increasing one or more of the main three parameters, over-sampling ratio, the order of the modulators and the number of bits used. Increasing each of these parameters presents a degree of challenge (i.e., the increase in the over-sampling ratio is limited by the technology and the power consumption requirement). This paper presents a new method to obtain 2nd order noise shaping from two 1st order, time interleaved modulators by applying cross-coupling of quantization noise between the two paths. The proposed sigma- delta ADC is implemented in 90 nm CMOS technology.
Keywords :
CMOS integrated circuits; modulators; sigma-delta modulation; 2nd order noise shaping; CMOS technology; quantization noise; size 90 nm; time interleaved modulators; wide-band 2-path cross-coupled sigma delta ADC; Bandwidth; CMOS technology; Circuit simulation; Delta-sigma modulation; Energy consumption; Frequency; Noise shaping; Pulse modulation; Quantization; Wideband;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4541644