Title :
2-26.5 GHZ On-Wafer Noise and S-Parameter Measurements Using a Solid State Tuner
Author_Institution :
Automatic Testing & Networking, Inc.
Abstract :
A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.
Keywords :
Acoustic reflection; Circuit noise; Measurement standards; Noise measurement; Power measurement; Scattering parameters; Solid state circuits; System testing; Temperature; Tuners;
Conference_Titel :
ARFTG Conference Digest-Winter, 34th
Conference_Location :
Ft. Lauderdale, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1989.323954
