DocumentCode :
1835311
Title :
Electromagnetic field immunity test system applying array antenna technology
Author :
Uchida, Takeshi ; Miyazaki, Chiharu ; Oka, Naoto ; Misu, Koichiro ; Konishi, Yoshihiko
Author_Institution :
Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kamakura, Japan
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
1
Lastpage :
5
Abstract :
We examined about the electromagnetic field immunity test system applying the array antenna technology. This system is able to get the electric field uniformity and the high power electric field near the antenna, in a wideband, by the beam forming technology. We constructed an electromagnetic field immunity test system consisting of 64 elements array antenna as a prototype. In this paper, we calculated the electric field uniformity near electromagnetic field immunity test system. We measured electric distributions and compared with the calculated value and the measured value. From these results, the validity of the calculation method of the electric field uniformity near the test system was confirmed.
Keywords :
antenna arrays; array signal processing; broadband antennas; electromagnetic fields; antenna array technology; beam forming technology; electric distribution measurement; electromagnetic field immunity test system; wideband antenna; Antenna arrays; Antenna measurements; Antenna radiation patterns; Broadband antennas; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; High power amplifiers; Slot antennas; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284694
Filename :
5284694
Link To Document :
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