• DocumentCode
    1835369
  • Title

    A real-time systolic array processor implementation of two-dimensional IIR filters for radio-frequency smart antenna applications

  • Author

    Madanayake, Arjuna ; Bruton, Len T.

  • Author_Institution
    Electr. & Comput. Eng. Dept, Univ. of Calgary, Calgary, AB
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    1252
  • Lastpage
    1255
  • Abstract
    High-speed radio-frequency (RF) applications of 2D HR real-time spatio-temporal digital filters in smart antenna arrays require architectures that are capable of high throughputs. A novel systolic-array architecture is proposed for such filters that operate at a throughput of one-frame-per-clock-cycle (OFPCC). This architecture uses a 2D extension of a well-known ID look-ahead (LA) speed maximization technique to achieve low critical path delays. A method is proposed, simulated, implemented and tested for the broadband beamforming of temporally down-converted RF signals. Temporal down-conversion is used in direct-conversion receivers, implying potential wireless applications. The prototype is operational on a Xilinx 4vsx35ff668-10 FPGA device at a clock frequency of 100 MHz, thereby achieving the required real-time OFPCC frame rate of 100 Million frames/sec. Implementations using high-speed VLSI technologies are envisaged and will facilitate 2D IIR filtering at GHz frame-rates.
  • Keywords
    IIR filters; VHF antennas; VHF filters; VLSI; adaptive antenna arrays; field programmable gate arrays; VLSI technologies; Xilinx 4vsx35ff668-10 FPGA device; broadband beamforming; direct-conversion receivers; frequency 100 MHz; look-ahead speed maximization technique; one-frame-per-clock-cycle; radiofrequency smart antenna applications; real-time systolic array processor implementation; systolic-array architecture; temporal down-conversion; two-dimensional IIR filters; wireless applications; Antenna arrays; Array signal processing; Delay; Digital filters; IIR filters; Prototypes; Radio frequency; Systolic arrays; Testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541652
  • Filename
    4541652